Burn-In Testing
A Solution Designed for Optoelectronic Components to Detect Early Failures
★ Product Features
☆ Plateform
✦Simple operation of setting time, temperature range. Multiple automatic measurement functions.
✦ Software with flexible editing function of setting different trays for different carrier.
✦ Data record management system providing historical data export and query functions.
☆ Real-time Monitoring to Provide Product Aging Curve
✦ Real-time monitoring of output current and input product voltage . It record data in units of trays.
✦ Electric damper makes the heating process and the end of the rapid cooling more controllable.
✦ Current correction function make it easy to control the software. It can correct the offset value automatically.
☆ Elastic & High-capacity Configure
✦ Different product aging tests can be carried out at the same time
✦ Each channel has an independent current source output, and the current accuracy is as high as ±1%.
✦ With 10 sets of trays, each tray has 64 product channels.
✦ Maximum of 640 DUTs can be carried. (with extensions)
☆ Security Protection
✦ Equipped with an electromagnetic valve switch, during the aging process, the automatic locking function prevents the door from being opened by mistake.
✦ Emergency switch button, when the emergency switch is triggered, the system will automatically power off.
✦ LED tri-color warning light and alarm buzzer provide bright sound and light warning to improve on-site management.
✦ Uninterruptible power supply system, so that the product can be safely powered off when the power is interrupted.
Burn-In Testing
Zequn Technology has a complete testing and burn-in solution for laser diodes (VCSEL, DFB LD, FP LD and LED) and light sensing devices (PD and APD). In the TO Level measurement of laser diodes, it can provide integrated measurement of LIV and optical wavelength, and also has the integration function of more advanced focal length measurement options. For the measurement of light sensing components, we provide PD electrical measurement parameters, dark current measurement and integration solutions, and light responsivity measurement functions. (For smaller PD components, there are also measurement solutions). In the aging scheme, different aging conditions are provided, including long-term constant current and high temperature aging conditions, and there is no surge in the circuit design, so you can use it with peace of mind. The Burn-In oven system is mainly divided into three parts, The first part is the oven part, which mainly has the function of heating and baking, which can reach 150˚C. The heating effect is good, about 30 minutes from room temperature to 100˚C; about 20~40 minutes from room temperature to 150˚C. The second part is the electronic control function. The third part is the control host, which will be equipped with a computer and a control program. Users can set the target temperature and baking time. Set PD voltage and LD current. And record the heating process and voltage and current state.
